Thursday, May 1, 2008
| Electrical, Structural and Defects Properties The volume consists of chapters written by a number of leading researchers in nitride materials and device technology with the emphasis on the dopants incorporations, impurities identifications, defects engineering, defects characterization, ion implantation, irradiation-induced defects, residual stress, structural defects and phonon confinement. http://mihd.net/2b1krc http://rapidshare.com |
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